Grating scatter can also be expressed in terms of the bi-directional scatter distribution function (BSDF), in units of inverse steradians, but so far no clear standard method for reporting grating scatter has been adopted.
Consider a spectrometer aligned so that the detector records the analytical wavelength λ in spectral order m. Instrumental stray light is often defined as light of either the wrong wavelength λ' ≠ λ or the wrong spectral order m' ≠ m that reaches the detector. It can be attributed to a number of factors:
- Grating scatter. Light scattered by the grating, as discussed above, may reach the detector and contribute to instrumental stray light. This type of stray light is absent for a "perfect" grating.
- Other diffraction orders. Light of the analytical wavelength λ is not only diffracted into order m, but into any other orders that exist. [The zero order, which always exists but is almost always of no value in the instrument, is particularly troublesome.] The other diffracted beams are not oriented toward the detector but if they reflect off a wall or another optics, or if they scatter off any interior surfaces in the spectrometer, some fraction of their intensity may reach the detector as instrumental stray light. This type of stray light is not absent even for a perfect grating, and requires proper instrumental design (e.g., baffles, light traps, &c.) to reduce.
- Other wavelengths in the same spectral order. Generally, spectrometers use a broad spectral source (e.g., a lamp or discharge tube) and the grating is intended to select a narrow spectral band from the output of the source and diffract it toward the detector. All other wavelengths that leave the source are diffracted as well, unless they are somehow filtered out, and may (if not properly trapped or baffled) reach the detector. In particular, the gratings equation indicates that light of wavelength λ' ≠ λ in order m' ≠ m will be diffracted toward the detector if m'λ' ≠ mλ.
Since detectors are not wavelength-selective (there would be little need for a grating in the system if they were), this energy contributes to instrumental stray light. As with light of the analytical wavelength from other diffraction orders, this type of stray light is not absent for a perfect grating and therefore baffles, light traps and particularly order-sorting filters may be required to reduce its effect.
Thus it is clear that a spectrometer containing a perfect grating (one with no scattered light) will still have nonzero instrumental stray light. The often-made statement "the grating is the greatest cause of stray light in the system" may well be true, but even a perfect grating must obey the grating equation.
The most common technique for measuring instrumental stray light is by using a set of high-pass cutoff optical filters (whose transmission curve looks like that in Figure 2). The instrument is tuned to the analytical wavelength λ and a series of filters, each with a successively higher λC (>λ), is placed in the beam and intensity readings taken at the detector. [Generally λC should exceed λ by at least 20 nm, in the visible spectrum, to ensure than virtually no light of the analytical wavelength λ passes through the filter and complicates the readings.] Nonzero readings indicate the presence of stray light. A proper study requires measurements at more than one analytical wavelength since stray light properties cannot be extrapolated (due to the different wavelength dependencies of the causes of grating scatter and instrumental stray light noted above, as well as the different efficiency curves in each diffracted order).